Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction

Kriegner, D.; Harcuba, P.; Veselý, J.; Lesnik, A.; Bauer, G.; Springholz, G.; Holý, V.

doi:10.1107/S1600576717000565

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 6
SXRM images of the same area of Bi₂Te₃ sample BT-B recorded with different Bragg reflections. (a), (b) Images of the normalized diffracted intensity of the ( $[1\bar{1}0.20]$ ) Bragg peak are shown for two azimuths different by 60°. The sum of the two images is shown in (c) and compared to the intensity obtained at the symmetric (000.15) Bragg peak in (d). Panels (e)–(h) show the corresponding intensity histograms. The normalization of the asymmetric peak intensities is performed in such a way that the histogram of the sum in (g) has a centre of mass of 1.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 2| April 2017| Pages 369-377

https://doi.org/10.1107/S1600576717000565

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