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Figure 4
Reflectivity curves of a silicon (001) wafer. The measurement time was 1000 s for curve a, 100 s for curve b, 10 s for curve c and 1 s for curve d. b–d are each shifted two orders of magnitude along the vertical axis for clarity. The solid line o shows the reflectivity calculated from the best-fit model. Other solid lines are the same as curve o, shifted for comparison with curves b–d.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 2| April 2017| Pages 570-575
https://doi.org/10.1107/S1600576717002461
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