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Figure 6
Contour plot of a 2-TCF for a model system that describes the evolution of a semiconductor surface under ion bombardment (Bikondoa et al., 2012BB3). The directions of the delay time (τ) for the CCS and ACS are indicated. The colour bar scale shows the degree of correlation.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 2| April 2017| Pages 357-368
https://doi.org/10.1107/S1600576717000577
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