Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications

Tran Thi, T.N.; Morse, J.; Caliste, D.; Fernandez, B.; Eon, D.; Härtwig, J.; Barbay, C.; Mer-Calfati, C.; Tranchant, N.; Arnault, J.C.; Lafford, T.A.; Baruchel, J.

doi:10.1107/S1600576717003831

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 2
Geometry of section topography. A ∼10 µm wide strip beam is used to characterize a cross section of the diamond plate through its thickness. For clarity, the multi-strip beam geometry is not shown.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 2| April 2017| Pages 561-569

https://doi.org/10.1107/S1600576717003831

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