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Figure 8
Multiple 400 reflection maps (in degrees) of (left) FWHM and (right) PPOS at different places across a diamond surface, obtained using section topography RCI. The colour scale shows the variation in crystalline quality in a virtual cross section through the ∼500 µm thick diamond plate of Sample 2. The size per image is ∼1.4 × 0.5 mm (vertical beam height × horizontal sample thickness).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 2| April 2017| Pages 561-569
https://doi.org/10.1107/S1600576717003831
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