Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications

Tran Thi, T.N.; Morse, J.; Caliste, D.; Fernandez, B.; Eon, D.; Härtwig, J.; Barbay, C.; Mer-Calfati, C.; Tranchant, N.; Arnault, J.C.; Lafford, T.A.; Baruchel, J.

doi:10.1107/S1600576717003831

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 9
(a) Rocking curve of the CVD overgrowth layer on an HPHT substrate and extracted FWHM maps (in degrees) fitted separately for substrate and layer. (b) An individual image from the set generated by the RCI technique.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 2| April 2017| Pages 561-569

https://doi.org/10.1107/S1600576717003831

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page