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Figure 12
Monochromatic section topographs of the four-wafer un-encapsulated stack imaged in Fig. 6[link]. Image width 8 mm. 220 reflection, Mo Kα1 and Mo Kα2 wavelengths taken on a Bruker X-ray UK JVQC-TT diffraction imaging tool. Image (b) is with the sample displaced by 1 mm from the position for image (a).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 2| April 2017| Pages 547-554
https://doi.org/10.1107/S1600576717003132
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