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Figure 4
Section images from different regions of a 10 mm × 10 mm × 180 µm die glued to an FR4 frame but not encapsulated with epoxy. The successive lines are the diffraction images obtained as the die is displaced successively by 0.5 mm in the Y direction. Specimen to detector distance (a) 177 mm, (b) 277 mm. 220 reflection, Bragg angle 4°, principal wavelength 0.027 nm. The projection of the diffraction vector onto the image is, as in all cases, vertically up the page.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 2| April 2017| Pages 547-554
https://doi.org/10.1107/S1600576717003132
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