view article
Figure 1
Comparison of experimental (grey filled contours) and simulated (red dotted contours) RSMs of reflections 004 [panels (a), (b) and (c)] and 114 [panels (d), (e) and (f)] for samples S1 [panels (a) and (d)], S2 [panels (b) and (e)] and S3 [panels (c) and (f)]. The intensities are plotted on a decimal logarithmic scale; the difference between adjacent contour lines is 100.5. The angles displayed in panels (d)–(f) denote the inclinations of the measured 114 RLPs with respect to the q|| axis.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 2| April 2017| Pages 555-560
https://doi.org/10.1107/S1600576717003612
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS