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Figure 2
(a) Broadening of the RLPs due mainly to screw TDs (ΔSα, blue solid arrows) and the limited lateral size of the mosaic blocks (ΔS||, grey dotted arrows), depicted in reciprocal space. The broadening ΔSα follows the Ewald sphere and scales with the length of the reciprocal-lattice vector, while ΔS|| is constant and always parallel to the q|| direction. Two Ewald hemispheres (blue dotted lines) are depicted for the measured diffractions 004 and 114. The angle ψ refers to the inclination of the reciprocal-lattice vector (114) from the surface normal (001). (b) The contributions ΔSα and ΔS|| to the total broadening (white solid line) of the 114 RSM for sample S2. The intensities are plotted on a decimal logarithmic scale; the difference between adjacent contour lines is 100.5.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 2| April 2017| Pages 555-560
https://doi.org/10.1107/S1600576717003612
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