Effect of screw threading dislocations and inverse domain boundaries in GaN on the shape of reciprocal-space maps

Barchuk, M.; Motylenko, M.; Lukin, G.; Pätzold, O.; Rafaja, D.

doi:10.1107/S1600576717003612

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
(a) BF TEM image of inversion domains in sample 3 and (b) the corresponding SAED pattern. (c), (d) DF TEM images in two beam conditions, (c) g = (002) and (d) g = ( $[{00{\overline 2}}]$ ), with the corresponding (e) experimental and (f) simulated CBED patterns.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 2| April 2017| Pages 555-560

https://doi.org/10.1107/S1600576717003612

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