NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering

Allen, A.J.; Zhang, F.; Kline, R.J.; Guthrie, W.F.; Ilavsky, J.

doi:10.1107/S1600576717001972

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 3
(a) Averaged slit-smeared I(Q) versus Q for repeated USAXS measurements. Vertical bars represent standard uncertainties for repeated USAXS measurements. (b) Fractional standard uncertainties for repeated USAXS measurements versus Q.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 2| April 2017| Pages 462-474

https://doi.org/10.1107/S1600576717001972

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