Journal of Applied Crystallography
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Figure 3
(
a
) EXAFS measurements around the Fe
K
edge at 7110 eV, with detail of the additional edge due to the nickel contaminant. (
b
) The amplitude signal of the back Fourier transform of
k
2
χ
(
R
) corresponding to the first shell.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50
|
Part 2
|
April 2017
|
Pages 508-518
https://doi.org/10.1107/S160057671700022X
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The IUCr is a scientific union serving the interests of crystallographers and other scientists employing crystallographic methods.