Scanning X-ray nanodiffraction from ferroelectric domains in strained K0.75Na0.25NbO3 epitaxial films grown on (110) TbScO3

Schmidbauer, M.; Hanke, M.; Kwasniewski, A.; Braun, D.; von Helden, L.; Feldt, C.; Leake, S.J.; Schwarzkopf, J.

doi:10.1107/S1600576717000905

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 1
(a) Calculated elastic strain energy density F(∊) of (100)_pc and (001)_pc oriented K_xNa_1−xNbO₃ epitaxial layers grown on (110) TbScO₃ substrates as a function of potassium content x. The two curves for (001)_pc differ in their in-plane orientation of the pseudocubic unit cell; for details see text. (b) Anisotropic in-plane strains ∊_xx and ∊_yy of an (001)_pc K_xNa_1−xNbO₃ thin film grown on a (110) TbScO₃ substrate as a function of potassium content x. Here, the epitaxial relationship between the K_xNa_1−xNbO₃ film and the TbScO₃ substrate is assumed to be [100]_pc || [001]_TSO and [010]_pc || $[[1{\overline 1}0]_{\rm TSO}]$ .

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 2| April 2017| Pages 519-524

https://doi.org/10.1107/S1600576717000905

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page