view article
Figure 4
(a) A two-dimensional detector frame recorded close to the (113)pc reciprocal lattice vector accumulated at a selected position on the sample. The feature P0 corresponds to the crystal truncation rod of the sample, while P1 and P2 are caused by the lateral periodicity of the domains along [[{\overline 1}12]_{\rm TSO}]. The dashed areas mark the regions of intensity integration. (b) The integrated intensity of P0 as a function of the vertical scattering vector component Qz. (c), (d) Integrated (113)pc intensity maps (5 × 5 µm) of (c) P1 and (d) P2 in real space.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 2| April 2017| Pages 519-524
https://doi.org/10.1107/S1600576717000905
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS