Scanning X-ray nanodiffraction from ferroelectric domains in strained K0.75Na0.25NbO3 epitaxial films grown on (110) TbScO3

Schmidbauer, M.; Hanke, M.; Kwasniewski, A.; Braun, D.; von Helden, L.; Feldt, C.; Leake, S.J.; Schwarzkopf, J.

doi:10.1107/S1600576717000905

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 5
(a) Integrated $[({\overline 1}13)_{\rm pc}]$ intensity map (5 × 5 µm) of the satellite peak P1. (b), (c) The corresponding detector frames accumulated at the marked positions in areas A and B, respectively. The dashed areas in panel (c) mark regions of intensity integration. (d), (e) The expected diffraction profiles when the incoming X-ray beam is (d) parallel and (e) perpendicular to the domain walls.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 2| April 2017| Pages 519-524

https://doi.org/10.1107/S1600576717000905

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