Scanning X-ray nanodiffraction from ferroelectric domains in strained K0.75Na0.25NbO3 epitaxial films grown on (110) TbScO3

Schmidbauer, M.; Hanke, M.; Kwasniewski, A.; Braun, D.; von Helden, L.; Feldt, C.; Leake, S.J.; Schwarzkopf, J.

doi:10.1107/S1600576717000905

Journal of Applied Crystallography Journal of Applied
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Figure 6
(a) Integrated intensity map (5 × 5 µm) of the (113)_pc CTR measured at Q_z = 4.65 Å⁻¹. (b) The corresponding integrated intensity as a function of Q_z measured at the sample positions A (blue symbols) and B (red symbols). (c) The corresponding integrated intensity as a function of Q_z in the vicinity of $[({\overline 1}13)_{\rm pc}]$ . The insets in parts (b) and (c) are enlargements of the Bragg peaks on a linear intensity scale.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 2| April 2017| Pages 519-524

https://doi.org/10.1107/S1600576717000905

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