Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

Abboud, A.; Kirchlechner, C.; Keckes, J.; Conka Nurdan, T.; Send, S.; Micha, J.S.; Ulrich, O.; Hartmann, R.; Strüder, L.; Pietsch, U.

doi:10.1107/S1600576717005581

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
(a) A sketch of the geometry of the experimental setup at the BM32 beamline of the ESRF. Two KB mirrors were used to focus the incident beam onto the sample. The pnCCD detector was mounted facing down on the sample. (b) The energy spectrum of the X-rays used.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 901-908

https://doi.org/10.1107/S1600576717005581

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