Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

Abboud, A.; Kirchlechner, C.; Keckes, J.; Conka Nurdan, T.; Send, S.; Micha, J.S.; Ulrich, O.; Hartmann, R.; Strüder, L.; Pietsch, U.

doi:10.1107/S1600576717005581

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 2
(a) Scanning electron microscopy image of the micro-bending beam of copper used in the experiment. The sample has been loaded in the [ $[{\overline 8}{\overline 4}1]$ ] direction. Dots along the dotted line indicate the measurement points. (b) Sketch of the sample with respect to the incident X-ray beam.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 901-908

https://doi.org/10.1107/S1600576717005581

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