Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

Abboud, A.; Kirchlechner, C.; Keckes, J.; Conka Nurdan, T.; Send, S.; Micha, J.S.; Ulrich, O.; Hartmann, R.; Strüder, L.; Pietsch, U.

doi:10.1107/S1600576717005581

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 3
(a) Two-dimensional intensity map with five visible Laue spots from the measurement at position 1 (reference) on the sample. (b) Corresponding energy spectrum showing the Laue spots' energy distributions and the fluorescence radiation from the sample (Cu) and detector housing (Fe and Cr), which are taken as background radiation.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 901-908

https://doi.org/10.1107/S1600576717005581

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