Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

Abboud, A.; Kirchlechner, C.; Keckes, J.; Conka Nurdan, T.; Send, S.; Micha, J.S.; Ulrich, O.; Hartmann, R.; Strüder, L.; Pietsch, U.

doi:10.1107/S1600576717005581

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
Flow chart for calibrating the position of the detector and calculating the strain tensor using an energy-dispersive two-dimensional detector. The chart is an extension of the work of Chung & Ice (1999

). Details are provided in the text.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 901-908

https://doi.org/10.1107/S1600576717005581

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