Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

Abboud, A.; Kirchlechner, C.; Keckes, J.; Conka Nurdan, T.; Send, S.; Micha, J.S.; Ulrich, O.; Hartmann, R.; Strüder, L.; Pietsch, U.

doi:10.1107/S1600576717005581

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 5
The experiment geometry. For every Laue spot on the pnCCD, a scattering vector $[{{\bf Q}_{{\rm lab}}}]$ is assigned. This vector is described either in the crystal frame through the Miller indices as $[{{\bf G}_{{hkl}}}]$ or in the laboratory-frame coordinate system by the measured position and energy of the Laue spot. Angles (φ, θ, ψ) were used to correct the tilt of the detector frame (X_d,Y_d,Z_d) with respect to the laboratory frame (X,Y,Z).

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 901-908

https://doi.org/10.1107/S1600576717005581

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page