Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

Abboud, A.; Kirchlechner, C.; Keckes, J.; Conka Nurdan, T.; Send, S.; Micha, J.S.; Ulrich, O.; Hartmann, R.; Strüder, L.; Pietsch, U.

doi:10.1107/S1600576717005581

Journal of Applied Crystallography Journal of Applied
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Figure 6
(a) Normal strain components $[\varepsilon _{{xx}},\varepsilon _{{yy}},\varepsilon _{{zz}}]$ , plotted as a function of distance along the central axis. The uncertainties are one standard deviation. The sawtooth pattern can be interpreted as the presence of a strain gradient along the central axis (see Fig. 8

). (b) The strain pattern translated to the normal stress components, showing a similar response. The right-hand y axis shows the corrected stress values after taking into account the uncertainty in the calibration measurement. The last stress value is around 100 MPa.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 901-908

https://doi.org/10.1107/S1600576717005581

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