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Figure 2
(a) SEM secondary electron (SE) micrograph of Ti-5553 alloy after solution treatment (holding at 1173 K for 30 min and quenching in water), showing the single β phase having equiaxed grains. (b) Neutron diffraction pattern. (c) TEM bright-field micrograph showing the striated structure in β grains. (d) TEM bright-field micrograph showing the improved contrast of the striations across the [(01{\overline 1})_{\beta}] extinction contour (the thick dark lines), where the deviation of the [(01{\overline 1})_{\beta}] reflecting plane from the Bragg position, sg, is zero and the two-beam condition is approximately met. The reciprocal vector [{\bf g}_{(01{\overline 1})}] is indicated. (e) Magnified TEM bright-field micrograph of an area in (d), showing fine strips within the striations.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 3| June 2017| Pages 795-804
https://doi.org/10.1107/S1600576717004150
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