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Figure 4
STEM HAADF image of the striated structure in the solution-treated specimen and the EDS line profiles of Cr, V, Al, Fe and Mo measured along the line indicated in the STEM HAADF image.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 3| June 2017| Pages 795-804
https://doi.org/10.1107/S1600576717004150
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