Reconstruction of the near-field distribution in an X-ray waveguide array

Zhong, Q.; Melchior, L.; Peng, J.; Huang, Q.; Wang, Z.; Salditt, T.

doi:10.1107/S1600576717004630

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
The measured two-dimensional far-field pattern of the WGA (a) and WGM (b) at 13.8 keV, recorded with the Eiger 4M pixel detector at a distance of D = 5.4 m behind the structures. (c) The integrated one-dimensional far-field curves, corresponding to (a) and (b).

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 701-711

https://doi.org/10.1107/S1600576717004630

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