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![[Figure 1]](vc5005fig1mag.jpg)
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Figure 1
Conceptual schematic of the interface-sensitive imaging technique by image reconstruction aided X-ray reflectivity. A monochromatic wide X-ray beam irradiates the full sample at a grazing-incidence angle θ and the reflected X-ray beam at the equivalent exit angle θ is recorded as an approximate one-dimensional profile by an X-ray CCD camera. The sample is rotated in-plane and many such one-dimensional profiles are recorded at different in-plane angles φ (usually plotted as a sinogram). By combining these scans with the grazing-incidence angle θ scan, many sinograms at different θ are collected as the raw data. The full µXR profiles from different sample positions are derived from the collection of the whole data set by a reconstruction process. |
![[Figure 1]](vc5005fig1.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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