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Figure 4
Selected reconstructed XR images [by the truncated singular value decomposition (TSVD) method] of the sample at wavevector transfers of (a) Qz = 0.0377 Å−1, (b) Qz = 0.0422 Å−1, (c) Qz = 0.0502 Å−1, (d) Qz = 0.0536 Å−1, (e) Qz = 0.0582 Å−1, (f) Qz = 0.0616 Å−1, (g) Qz = 0.0845 Å−1 and (h) Qz = 0.1016 Å−1, where the data are plotted on linear colour scales. The number of projections for image reconstruction: 90 views. (i) An optical image of the patterned sample before the Ti layer was deposited. The image was trimmed to have the same scale as the reconstructed images.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 3| June 2017| Pages 712-721
https://doi.org/10.1107/S160057671700509X
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