Processing two-dimensional X-ray diffraction and small-angle scattering data in DAWN 2

Filik, J.; Ashton, A.W.; Chang, P.C.Y.; Chater, P.A.; Day, S.J.; Drakopoulos, M.; Gerring, M.W.; Hart, M.L.; Magdysyuk, O.V.; Michalik, S.; Smith, A.; Tang, C.C.; Terrill, N.J.; Wharmby, M.T.; Wilhelm, H.

doi:10.1107/S1600576717004708

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
Work flow for obtaining the parameters of the diffraction geometry. After a (set of) two-dimensional calibration image(s) has been loaded and the process has been initialized, the details of the data define how to proceed. Data with almost complete Debye–Scherrer rings of low ellipticity are suited for the automated process. Highly elliptical or partial rings require a manual treatment. Ultimately the calibration information is saved and made available for the data processing.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 959-966

https://doi.org/10.1107/S1600576717004708

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