Processing two-dimensional X-ray diffraction and small-angle scattering data in DAWN 2

Filik, J.; Ashton, A.W.; Chang, P.C.Y.; Chater, P.A.; Day, S.J.; Drakopoulos, M.; Gerring, M.W.; Hart, M.L.; Magdysyuk, O.V.; Michalik, S.; Smith, A.; Tang, C.C.; Terrill, N.J.; Wharmby, M.T.; Wilhelm, H.

doi:10.1107/S1600576717004708

Journal of Applied Crystallography Journal of Applied
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Figure 4
Screenshot of the Processing perspective embedded in DAWN 2, showing (a) the Data Slice view with multiple files loaded for batch processing, (b) the raw detector data image in the Input view, (c) the Processing view with several processing steps, (d) the Output view with the processed input data at the selected position in the processing chain (Cake Remapping) and (e) the Model view of the selected Cake Remapping processing step with its configurable parameters.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 959-966

https://doi.org/10.1107/S1600576717004708

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