Processing two-dimensional X-ray diffraction and small-angle scattering data in DAWN 2

Filik, J.; Ashton, A.W.; Chang, P.C.Y.; Chater, P.A.; Day, S.J.; Drakopoulos, M.; Gerring, M.W.; Hart, M.L.; Magdysyuk, O.V.; Michalik, S.; Smith, A.; Tang, C.C.; Terrill, N.J.; Wharmby, M.T.; Wilhelm, H.

doi:10.1107/S1600576717004708

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 5
Real-time monitoring of a solid-state transformation. (a) A subset of diffractograms around a temperature-induced crystallization process. Only those diffractograms where the reaction took place are shown [from frame 75 (blue) to frame 105 (red)]. (b) The evolution of the peak position and its FWHM over the entire measurements indicate at which frame, i.e. temperature, the transformation occurred.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 959-966

https://doi.org/10.1107/S1600576717004708

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