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Figure 2
Symmetric scans of the magnitudes of the amplitude of the diffracted wave from a sample ([|D|]) consisting of two layers (Ge and Si) of the same thickness (20 nm) for types of transition layers (a) a, (b) b and (c) c. Reflection 004, roughness parameter σ = 2 nm. [\omega_{\rm in}] is the angle of incidence (with respect to the sample's surface). Light-green and dark-blue lines correspond to zero and nonzero roughness, respectively. Under the plots a qualitative description of the susceptibilities near the interface as a function of z is given.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 3| June 2017| Pages 681-688
https://doi.org/10.1107/S1600576717004137
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