view article
Figure 11
(a) Diffraction spots on the detector area collected in a 360° spin of the sample around the diffraction vector of reflection [26{\overline 1}]. Sample–detector distance is 74.7 mm. X-rays of 10 keV, σ polarization. (b) Indexing of diffraction spots by simulation of the rotating crystal method [using the simulation routine in Appendix B of Morelhão (2016BB27)]. Area detector width in horizontal direction.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 3| June 2017| Pages 689-700
https://doi.org/10.1107/S1600576717004757
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS