Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 3
Comparison of simulated XRD patterns according to NH3 and N3
e
model structures. X-rays of 10 keV,
σ
polarization.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50
|
Part 3
|
June 2017
|
Pages 689-700
https://doi.org/10.1107/S1600576717004757
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The IUCr is a scientific union serving the interests of crystallographers and other scientists employing crystallographic methods.