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Figure 1
Simulated I(q) data with 1% added Gaussian noise before (dashed red) and after smearing (points); the solid line shows the fit [\widetilde{{\bf I}} = \widetilde{{\rm K}}{\bf A}]. The desmeared data come from the solution A(r) via [{\bf I} = {\rm K}{\bf A}], where the pinhole-collimated operator K(q,r) results from substitution of a delta function for the slit geometry W(t) in equation (6)[link]. The upper inset shows the generating distribution (dashed red) and the reconstruction A(r) (black); the lower inset shows a projection of the evidence [{\cal P}(\lambda,r_{{\rm {max}}})] surface onto the [{\cal P}]–λ plane during the search for A(r).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 3| June 2017| Pages 734-740
https://doi.org/10.1107/S1600576717006446
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