Threefold rotational symmetry in hexagonally shaped core–shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imaging

Davtyan, A.; Krause, T.; Kriegner, D.; Al-Hassan, A.; Bahrami, D.; Mostafavi Kashani, S.M.; Lewis, R.B.; Küpers, H.; Tahraoui, A.; Geelhaar, L.; Hanke, M.; Leake, S.J.; Loffeld, O.; Pietsch, U.

doi:10.1107/S1600576717004149

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 2
RSMs from two single wires measured at symmetric Bragg reflections. (a), (b) Projections of the three-dimensional RSM from NW1 measured at the 111 Bragg reflection. (c) Slice from the three-dimensional RSM in the q_xy plane which is used in PR. (d), (e), (f) Projections of the GaAs 333 reflection for NW2. (e) and (f) show slices from the top and bottom peaks in the q_xy plane.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 673-680

https://doi.org/10.1107/S1600576717004149

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page