Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction

Borcha, M.; Fodchuk, I.; Solodkyi, M.; Baidakova, M.

doi:10.1107/S1600576717006574

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
Pattern composed of calculated fragments of diffraction scans with three-beam $[(31{\overline 5}/3{\overline 1}5)]$ and $[(35{\overline 1}/3{\overline 5}1)]$ reflections for Al_xIn_1−xSb.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 722-726

https://doi.org/10.1107/S1600576717006574

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