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Figure 2
Calculated fragments of diffraction patterns for a two-layered Zn1−xMnxSe system at x = 0 and x = 0.15, representing substantial changes in not only the angular positions of multi-beam reflections depending on x but also their intensities.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 3| June 2017| Pages 722-726
https://doi.org/10.1107/S1600576717006574
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