Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction

Borcha, M.; Fodchuk, I.; Solodkyi, M.; Baidakova, M.

doi:10.1107/S1600576717006574

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 3
Pattern composed of calculated fragments of diffraction scans with three-beam reflections for Zn_1−xMn_xSe. Coincidental noncoplanar four-beam diffractions are the result of superposition of three-beam reflections: $[(006,5{\overline 1}1/{\overline 5}15)]$ and $[(006,311/{\overline 3}{\overline 3}5)]$ , $[(006,511/{\overline 5}{\overline 1}5)]$ and $[(006,331/{\overline 3}{\overline 3}5)]$ , $[(006,5{\overline 1}1/{\overline 5}15)]$ and $[(006,511/{\overline 5}{\overline 1}5)]$ at different values of x (λ/a).

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 722-726

https://doi.org/10.1107/S1600576717006574

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