Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction

Borcha, M.; Fodchuk, I.; Solodkyi, M.; Baidakova, M.

doi:10.1107/S1600576717006574

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 5
Change in positions of $[(006,{\overline 5}15,{\overline 5}11)]$ and $[(006,{\overline 1}{\overline 3}5,{\overline 1}{\overline 3}1)]$ reflections depending on the sign of Δa

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 3| June 2017| Pages 722-726

https://doi.org/10.1107/S1600576717006574

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