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Figure 1
Schematic geometry of the GISANS experiment with a vertical sample holder (D22 and NG3-SANS). The dispersion is sealed between the silicon and sapphire crystals. [\theta_{\rm i}] is the incident angle of the beam; [\theta_{\rm f}] is the angle of the scattered beam on the horizontal plane; α is the angle of the scattered beam on the vertical plane. A scattered beam with [\theta_{\rm f} = \theta_{\rm i}] is shown with red arrows and a scattered beam with [\theta_{\rm f}\ne\theta_{\rm i}] in green.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 4| August 2017| Pages 1066-1074
https://doi.org/10.1107/S1600576717007518
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