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Figure 3
(a) Distributions of the simulated intensities of a single PS II complex after convoluting the three-dimensional reciprocal-space array of diffraction intensities with cubic voxels of widths 1, 2 and 3 times the Nyquist sampling rate of the continuous diffraction intensity. The negative exponential distribution of the point-sampled intensities is shown with the dashed line. (b) Plot of 1/NS = Var[I]/Mean[I]2 versus the voxel width, w. The voxel width is normalized to the Nyquist sampling distance. Shown in orange is a Gaussian of width 2.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 4| August 2017| Pages 1084-1103
https://doi.org/10.1107/S160057671700749X
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