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Figure 4
AFM images of the Pd(48 nm)/APA underlayer/substrate, (a) as deposited and (b) after the in situ XRD measurement (after nine cycles of 10% hydrogen loading).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 5| October 2017| Pages 1478-1489
https://doi.org/10.1107/S1600576717012638
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