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Figure 5
Depth dependence of (a) displacement and (b) occupancy of the LaAlO3/SrTiO3 heterostructure. The horizontal axis represents the layer index n. Error bars represent the standard deviation [{\sigma}] of [{P(\theta _{i}|{\bf I}_{{\rm exp}})}]. The [{\sigma}] values for some parameters are smaller than the symbol size.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 6| December 2017| Pages 1611-1616
https://doi.org/10.1107/S1600576717013292
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