Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 3
A contour plot of the variance of a
SHELXL
weighted multipole refinement calculated for a range of
a
and
b
values. The optimized weight determined by
CAPOW
and the actual minimum variance of the grid are also displayed.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51
|
Part 1
|
February 2018
|
Pages 200-204
https://doi.org/10.1107/S1600576717016600
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The IUCr is a scientific union serving the interests of crystallographers and other scientists employing crystallographic methods.