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Figure 1
A schematic drawing of the diffraction geometry. X-rays are diffracted by a crystal and then captured by a pixel-array detector placed perpendicular to the diffracted beam. The recorded diffraction pattern corresponds to a slice in the reciprocal space near the reciprocal lattice vector, h, of the excited reflection. At each rocking angle, this slice is shifted along the swing direction of the reciprocal lattice vector, [\hat{\boldtheta}]. An assembly of far-field diffraction patterns at different angles forms a data set describing the intensity distribution in the reciprocal space in three dimensions.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 1| February 2018| Pages 167-174
https://doi.org/10.1107/S1600576718000274
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