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 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
accessReconstructing three-dimensional protein crystal intensities from sparse unoriented two-axis X-ray diffraction patterns. Corrigendum
aLaboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853, USA, bCornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, NY 14853, USA, cMacromolecular Diffraction Facility at CHESS (MacCHESS), Cornell University, Ithaca, NY 14853, USA, and dKavli Institute for Nanoscale Science, Cornell University, Ithaca, NY 14853, USA
*Correspondence e-mail: smg26@cornell.edu
A figure in the article by Lan, Wierman, Tate, Philipp, Elser & Gruner [J. Appl. Cryst. (2017), 50, 985–993] is corrected.
Keywords: X-ray serial microcrystallography; sparse data; EMC algorithm; protein microcrystallography; synchrotron radiation sources.
The color code of the curves in Fig. 3 on p. 989 of the article by Lan et al. (2017![[Lan, T.-Y., Wierman, J. L., Tate, M. W., Philipp, H. T., Elser, V. & Gruner, S. M. (2017). J. Appl. Cryst. 50, 985-993.]](../../../../../../logos/arrows/j_arr.gif "Lan, T.-Y., Wierman, J. L., Tate, M. W., Philipp, H. T., Elser, V. & Gruner, S. M. (2017). J. Appl. Cryst. 50, 985-993.")
) is incorrect. The correct code (as shown in Fig. 1) is as follows:
![[Figure 1]](yr9017fig1thm.gif) | Figure 1 The corrected version of Fig. 3 of Lan et al. (2017 ). The average signal-to-noise ratio of the integrated reflections from the converged intensity maps at different stages of the reconstruction. The increase of ![[\langle I/\sigma_I\rangle]](teximages/yr9017fi1.gif) at high q indicates the reconstruction of high-resolution peaks. The 2.27 Å resolution determined by CC* is marked by the black dashed line. |
Topmost (black) curve: local (nc, nf) = (60, 150)
Second from top (blue) curve: local (nc, nf) = (60, 100)
Third from top (red) curve: standard, n = 40
Bottom (green) curve: local (nc, nf) = (40, 60)
References
Lan, T.-Y., Wierman, J. L., Tate, M. W., Philipp, H. T., Elser, V. & Gruner, S. M. (2017). J. Appl. Cryst. 50, 985–993. Web of Science CrossRef CAS IUCr Journals Google Scholar
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| JOURNAL OF APPLIED CRYSTALLOGRAPHY |
