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Figure 8
(a) Experimental and simulated radiographs of three Cu samples with different thicknesses at a sample-to-detector distance of 4 mm. (b) Normalized intensities averaged over the samples' indicated region of interest at different sample-to-detector distances.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 2| April 2018| Pages 386-394
https://doi.org/10.1107/S1600576718001607
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