view article
Figure 18
(a) An RSM measured in the unpatterned planar layer. (b) The X-ray beam goes through a series of mosaic crystal blocks with random tilts of about ±0.2°. This holds for each region with different Ge content.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 2| April 2018| Pages 368-385
https://doi.org/10.1107/S1600576718001450
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS