journal menu
![[Figure 2]](rg5143fig2mag.jpg)
|
|
Figure 2
Perspective view SEM micrograph of an isolated 35 µm tall graded SiGe crystal which was used for the nanodiffraction experiment. The image also shows a schematic sketch of the scattering geometry with incident beam K0 and exit beam Ks defining the scattering vector Q. The yellow vectors define the reciprocal-space coordinates (Qx, Qy, Qz) and the blue arrows indicate the xy movements of the piezo stage. |
![[Figure 2]](rg5143fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
